Wednesday, June 12, 2002, 10:30 AM - 12:00 PM | Room: 287 SESSION 25    New Test Methods Targeting Non-Classical Faults    Chair: Rob Aitken - Agilent Technologies, Santa Clara, CA    Organizers: Miron Abramovici, TM Mak    Complexity of VLSI testing requires targeting new type of faults in addition to the classical stuck-at fault model. The session illustrates different aspects of this struggle.      25.1 Embedded Software-Based Self-Testing for SoC Design    Speaker(s): Angela Krstic - Univ. of California, Santa Barbara, CA    Author(s): Angela Krstic - Univ. of California, Santa Barbara, CA Wei Cheng Lai - Univ. of California, Santa Barbara, CA Li Chen - Univ. of California at San Diego, La Jolla, CA Kwang Ting (Tim) Cheng - Univ. of California, Santa Barbara, CA Sujit Dey - Univ. of California atSan Diego, La Jolla, CA      25.2 A Novel Wavelet Transform Based Transient Current Analysis for Fault Detection and Localization    Speaker(s): Swarup K. Bhunia - Purdue Univ., West Lafayette, IN    Author(s): Swarup K. Bhunia - Purdue Univ., West Lafayette, IN Kaushik Roy - Purdue Univ., West Lafayette, IN Jaume Segura - Balearic Islands Univ., Mallorca, Spain      25.3 Signal Integrity Fault Analysis Using Reduced-Order Modeling    Speaker(s): Mehrdad Nourani - Univ. of Texas, Richardson, TX    Author(s): Amir Attarha - Univ. of Texas, Richardson, TX Mehrdad Nourani - Univ. of Texas, Richardson, TX      25.4 Enhancing Test Efficiency for Delay Fault Testing Using Multiple-Clocked Schemes    Speaker(s): Li C. Wang - Univ. of California, Santa Barbara, CA    Author(s): Jing Jia Liou - Univ. of California at San Diego, Santa Barbara, CA Li C. Wang - Univ. of California, Santa Barbara, CA Kwang Ting (Tim) Cheng - Univ. of California, Santa Barbara, CA Jennifer Dworak - Texas A&M Univ., College Station, CA Ray Mercer - Texas A&M Univ., College Station, CA Tom Williams - Synopsys, Inc., Boulder, CO