Tuesday, June 3, 2003, 4:30 PM - 6:30 PM | Room: AB

   SESSION 11
  Managing Leakage Power
  Chair: Siva Narendra - Intel Corp., Hillsboro, OR
  Organizers: Renu Mehra

  Leakage power consumption is projected to be one of the most dominant power components in very deep-submicron technologies. Papers in this session address different issues related to leakage power estimation and minimization.

  11.1   Accurate Estimation of Total Leakage Current in Scaled CMOS Logic Circuits Based on Compact Current Modeling
  Speaker(s): Saibal Mukhopadhyay - Purdue Univ., West Lafayette, IN
  Author(s): Saibal Mukhopadhyay - Purdue Univ., West Lafayette, IN
Arijit Raychowdhury - Purdue Univ., West Lafayette, IN
Kaushik Roy - Purdue Univ., West Lafayette, IN
  11.2Analysis and Minimization Techniques for Total Leakage Considering Gate Oxide Leakage
  Speaker(s): Dongwoo Lee - Univ. of Michigan, Ann Arbor, MI
  Author(s): Dongwoo Lee - Univ. of Michigan, Ann Arbor, MI
Wesley Kwong - Univ. of Michigan, Ann Arbor, MI
Dennis Sylvester - Univ. of Michigan, Ann Arbor, MI
David Blaauw - Univ. of Michigan, Ann Arbor, MI
  11.3Distributed Sleep Transistor Network for Power Reduction
  Speaker(s): Changbo Long - Univ. of Wisconsin, Madison, WI
  Author(s): Changbo Long - Univ. of Wisconsin, Madison, WI
Lei He - Univ. of California, Los Angeles, CA
  11.4sImplications of Technology Scaling on Leakage Reduction Techniques
  Speaker(s): Yuh-Fang Tsai - Penn State Univ., University Park, PA
  Author(s): Yuh-Fang Tsai - Penn State Univ., University Park, PA
David Duarte - Intel Corp., Portland, OR
Vijaykrishnan N. - Penn State Univ., University Park, PA
Mary J. Irwin - Penn State Univ., University Park, PA
  11.5sStatic Leakage Reduction through Simultaneous Threshold Voltage and State Assignment
  Speaker(s): David Blaauw - Univ. of Michigan, Ann Arbor, MI
  Author(s): Dongwoo Lee - Univ. of Michigan, Ann Arbor, MI
David Blaauw - Univ. of Michigan, Ann Arbor, MI