Frank Liu - IBM Corp., Austin, TX
| | Organizers: Sachin S Sapatnekar
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| | Model order reduction is a critical component in CAD extraction and verification. The first two papers focus on realizable reduction of RLCK networks. The third paper proposes a novel reduction method incorporating skin effect, and the final paper addresses modeling of nonuniform transmission lines.
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| |  14.1 |
Realizable Parasitic Reduction Using Generalized Y-Δ Transformation
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| | Speaker(s): | Zhanhai Qin - Univ. of California at San Diego, La Jolla, CA
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| | Author(s): | Zhanhai Qin - Univ. of California at San Diego, La Jolla, CA
C.K. Cheng - Univ. of California at San Diego, La Jolla, CA
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| | 14.2 | Realizable RLCK Circuit Crunching |
| | Speaker(s): | Chirayu S. Amin - Northwestern Univ., Evanston, IL
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| | Author(s): | Chirayu S. Amin - Northwestern Univ., Evanston, IL
Masud H. Chowdhury - Northwestern Univ., Evanston, IL
Yehea I. Ismail - Northwestern Univ., Evanston, IL
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| | 14.3 | Efficient Model Order Reduction Including Skin Effect |
| | Speaker(s): | Shizhong Mei - Northwestern Univ., Evanston, IL
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| | Author(s): | Shizhong Mei - Northwestern Univ., Evanston, IL
Chirayu Amin - Northwestern Univ., Evanston, IL
Yehea I. Ismail - Northwestern Univ., Evanston, IL
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| | 14.4 | Model Order Reduction of Nonuniform Transmission Lines Using Integrated Congruence Transform |
| | Speaker(s): | Emad F. Gad - Carleton Univ., Ottawa, ON, Canada
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| | Author(s): | Emad F. Gad - Carleton Univ., Ottawa, ON, Canada
Michel Nakhla - Carleton Univ., Ottawa, ON, Canada
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