Conference Program     At-a-Glance    Thursday


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THURSDAY
Exhibit Hours - 9:00 am to 1:00 pm
Rm# 306/308 307 305 304 303 301
Ses# Session 40 Session 41 Session 42 Session 43 Session 44 Session 45 HoT
TIME Pavilion
Panels
9:00  
9:15  
9:30  
9:45  
10:00 Developing Consumer SoCs - IP and Automation or Sticks and Duct Tape?
10:15
10:30
10:45
11:00 Wireless USB - The Next Ubiquitous Connectivity Standard?
11:15
11:30
11:45  
12:00 Troubleshooting the Multi-Processor SoC Design Flow
12:15
12:30
12:45  
1:00  
8:30 to 10:00

 

PANEL: Tomorrow's Analog: Just Dead or Just Different

 

Nanotubes and Nanowires

 

Simulation Assisted Formal Verification

 

Yield Analysis and Improvement

Approaches to Soft Error Mitigation

Design-
Technology Interaction

BREAK 10:00 - 10:30 am
Ses# Session 46 Session 47 Session 48 Session 49 Session 50 Session 51
10:30 to 12:00

 

PANEL: Building a Verification Test Plan: Trading Brute Force for Finesse

Special Session: More Moore's Law and More than Moore's Law

 

Formal Specification and Verification Testbench Generation

 

Analysis
and Optimization Issues in NoC Design

Special Session:
Key Technologies for Beyond the Die

Analog Design
and
Design Assistance

Best Paper Award Presentations and Keynote Addresss
The Challenges of Convergence
12:45 - 1:45 pm | Gateway Ballroom
Alessandro Cremonesi -
STMicroelectronics, Strategy and System Tech. Group Vice President and Advance System Technology General Manager
Ses# Session 52 Session 53 Session 54 Session 55 Session 56 Session 57 HoT  
2:00 to 4:00

 

High-Performance Simulation of Transaction Level and Dataflow Models

 

Nano-
and
Bio-Chip Design

 

Logic
and
Sequential Synthesis

Low Power Circuit Design

Beyond-the-Die Circuit and System Integration

 

New Ideas
in
Analog/RF Modeling and Simulation

 
BREAK 4:00 - 4:30 pm
Ses# Session 58 Session 59 Session 60 Session 61 Session 62  
4:30 to 6:00

 

Advanced Methods for Interconnect Extraction, Clocks and Reliability

 

PANEL: DFM Where's the Proof of Value?

 

Bounded Model Checking
and Equivalence Verification

 

Test Response Compaction and
ATPG

 

Placement