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 |  TUESDAY, June 14, 2005, 4:30 PM - 6:30 PM | Room: 207ABC |
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TOPIC AREA: DESIGN FOR MANUFACTURING (methods)
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SESSION 11
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| | PANEL: DFM Rules!
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| | Chair: Naveed Sherwani - Open-Silicon, Sunnyvale, CA
| | | Organizers: Susan Lippincott Mack
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| | At 90 nm, yields appeared unpredictable. Two chips designed with the same methodology and design rules deliver completely different manufacturing yields. This panel will discuss the reasons for this phenomenon and talk about future trends in DFM that will need to be addressed for success below 100 nm.
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| | 11.1 |
PANEL: DFM Rules!
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| | Speaker(s): | Atul Sharan - Clear Shape Technologies, Inc., Sunnyvale, CA
Alex Alexanian - Ponte Solutions, Inc., Mountain View, CA
Harold Lehon - KLA-Tencor Corp., San Jose, CA
Peter Rabkin - Xilinx, Inc., San Jose, CA
Carlo Guardiani - PDF Solutions, Inc., San Jose, CA
Premal Buch - Magma Design Automation, Inc., Santa Clara, CA
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