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| THURSDAY, June 16, 2005, 2:00 PM - 4:00 PM | Room: 210CD | ||
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TOPIC AREA: SYSTEM-LEVEL DESIGN AND VERIFICATION (mixed tools and methods) | ||
| SESSION 47 | |||
| Tools and Methods for the Verification of Processors and Processor-Based Systems | |||
| Chair: Raghuram Tupuri - AMD, Austin, TX | |||
| Organizers: Avi Ziv, Erich Marschner | |||
| Modern systems are increasingly becoming microprocessor-based. Functional verification of microprocessors has long been recognized as the toughest challenge in verification. The papers in this session stress the need for proper verification planning, highlight the need for test plan automation, and illustrate the use of sophisticated test generation techniques to thoroughly cover corner cases. Case studies highlight the application of a combination of verification techniques to successfully verify these complex systems. | |||
 47.1 |
A Generic Micro-Architectural Test Plan Approach for Microprocessor Verification |
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| Speaker(s): | Eyal Bin - IBM Corp., Haifa, Israel | ||
| Author(s): | Allon Adir - IBM Corp., Haifa, Israel Hezi Azatchi - IBM Corp., Haifa, Israel Eyal Bin - IBM Corp., Haifa, Israel Ofer Peled - IBM Corp., Haifa, Israel Kirill Shoikhet - IBM Corp., Haifa, Israel | ||
| 47.2s | IODINE: A Tool to Automatically Infer Dynamic Invariants for Hardware Designs | ||
| Speaker(s): | Sudheendra Hangal - Sun Microsystems, Bangalore, India | ||
| Author(s): | Sudheendra Hangal - Sun Microsystems, Bangalore, India Naveen Chandra - Sun Microsystems, Bangalore, India Sridhar Narayanan - P.A. Semi Inc., Santa Clara, CA Sandeep Chakravorty - Sun Microsystems, Bangalore, India | ||
| 47.3s | VLIW ? A Case Study of Parallelism Verification | ||
| Speaker(s): | Michal Rimon - IBM Corp., Haifa, Israel | ||
| Author(s): | Allon Adir - IBM Corp., Haifa, Israel Yaron Arbetman - IBM Corp., Haifa, Israel Massimo A Calligaro - STMicroelectronics, Grenoble Cedex, France Andrew Cofler - STMicroelectronics, Grenoble Cedex, France Bella Dubrov - IBM Corp., Haifa, Israel Gabriel Duffy - STMicroelectronics, Grenoble Cedex, France Yossi Lichtenstein - IBM Corp., Haifa, Israel Michal Rimon - IBM Corp., Haifa, Israel Michael Vinov - IBM Corp., Haifa, Israel | ||
| 47.4 | StressTest: An Automatic Approach to Test Generation via Activity Monitors | ||
| Speaker(s): | Ilya Wagner - Univ. of Michigan, Ann Arbor, MI | ||
| Author(s): | Ilya Wagner - Univ. of Michigan, Ann Arbor, MI Valeria Bertacco - Univ. of Michigan, Ann Arbor, MI Todd Austin - Univ. of Michigan, Ann Arbor, MI | ||
| 47.5 | Smart Diagnostics for Configurable Processor Verification | ||
| Speaker(s): | Sadik Ezer - Tensilica, Inc., Santa Clara, CA | ||
| Author(s): | Sadik Ezer - Tensilica, Inc., Santa Clara, CA Scott Johnson - Tensilica, Inc., Santa Clara, CA | ||
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