Conference Program    Technical Session

WEDNESDAY, July 26, 2006, 10:30 AM - 12:00 PM | Room: 304
TOPIC AREA:  VERIFICATION AND TEST


   SESSION 25
  The Test Bin
  Chair: Roni Khazaka - McGill Univ., Montreal, Canada
  Organizers: Cecilia Metra, Erik Jan Marinissen

  The first paper is on software-based test for microprocessors. The second paper is on re-ordering test patterns to improve diagnostic resolution. The third paper proposes on-chip DFT for impedance matching of I/Os.

  25.1   Systematic Software-Based Self-Test for Pipelined Processors
  Speaker(s): Mihalis Psarakis - Univ. of Piraeus, Piraeus, Greece
  Author(s): Mihalis Psarakis - Univ. of Piraeus, Piraeus, Greece
Dimitris Gizopoulos - Univ. of Piraeus, Piraeus, Greece
Miltiadis Hatzimihail - Univ. of Piraeus, Piraeus, Greece
Antonis Paschalis - Univ. of Athens, Athens, Greece
Anand Raghunathan - NEC Labs America, Princeton, NJ
Srivaths Ravi - NEC Labs America, Princeton, NJ
  25.2  A Test Pattern Ordering Algorithm for Diagnosis with Truncated Fail Data
  Speaker(s): Gang Chen - Univ. of Iowa, Iowa City, IA
  Author(s): Gang Chen - Univ. of Iowa, Iowa City, IA
Sudhakar M. Reddy - Univ. of Iowa, Iowa City, IA
Irith Pomeranz - Purdue Univ., West Lafayette, IN
Janusz Rajski - Mentor Graphics Corp., Wilsonville, OR
  25.3  DFT for Controlled-Impedance I/O Buffers
  Speaker(s): Ahmad Alyamani - King Fahd Univ. of Petroleum and Mines, Dhahran, Saudi Arabia
  Author(s): Ahmad Alyamani - King Fahd Univ. of Petroleum and Mines, Dhahran, Saudi Arabia