Conference Program    Technical Session

THURSDAY, July 27, 2006, 4:30 PM - 6:00 PM | Room: 304
TOPIC AREA:  VERIFICATION AND TEST


   SESSION 61
  Test Response Compaction and ATPG
  Chair: Anuja Sehgal - Advanced Micro Devices, Inc., Sunnyvale, CA
  Organizers: Kazumi Hatayama, Patrick Girard

  Increasing circuit complexity and new test methods for deep-submicron defects make the test data volume grow to an intractable size. After compressing the test stimuli, the current research wave addresses compaction of test responses. The last paper is an example of a new test method addressing deep-submicron defects.

  61.1   Unknown-Tolerance Analysis and Test-Quality Control for Test Response Compaction Using Space Compactors
  Speaker(s): Mango Chia-Tso Chao - Univ. of California, Santa Barbara, CA
  Author(s): Mango Chia-Tso Chao - Univ. of California, Santa Barbara, CA
Tim Cheng - Univ. of California, Santa Barbara, CA
Seongmoon Wang - NEC-Labs America, Princeton, NJ
Srimat T. Chakradhar - NEC-Labs America, Princeton, NJ
Wen-long Wei - NEC-Labs America, Princeton, NJ
  61.2  Test Response Compactor with Programmable Selector
  Speaker(s): Grzegorz Mrugalski - Mentor Graphics Corp., Wilsonville, OR
  Author(s): Grzegorz Mrugalski - Mentor Graphics Corp., Wilsonville, OR
Janusz Rajski - Mentor Graphics Corp., Wilsonville, OR
Jerzy Tyszer - Poznan Univ. of Tech., Poznan, Poland
  61.3s  Fault Detection and Diagnosis with Parity Trees for Space Compaction of Test Responses
  Speaker(s): Sandeep K. Goel - Philips Research Labs, Eindhoven, Netherlands
  Author(s): Harald Vranken - Philips Research Labs, Eindhoven, Netherlands
Sandeep K. Goel - Philips Research Labs, Eindhoven, Netherlands
Andreas Glowatz - Philips Semiconductors, Hamburg, Germany
Juergen Schloeffel - Philips Semiconductors, Hamburg, Germany
Friedrich Hapke - Philips Semiconductors, Hamburg, Germany
  61.4s  Multiple-Detect ATPG Based on Physical Neighborhoods
  Speaker(s): Jeffrey E. Nelson - Carnegie Mellon Univ., Pittsburgh, PA
  Author(s): Jeffrey E. Nelson - Carnegie Mellon Univ., Pittsburgh, PA
Jason G. Brown - Carnegie Mellon Univ., Pittsburgh, PA
Rao Desineni - Carnegie Mellon Univ., Pittsburgh, PA
Ronald D. Blanton - Carnegie Mellon Univ., Pittsburgh, PA