Panel discussion will focus on best practices and methodologies for variation-aware custom IC design for memory, standard cell, analog/RF, and custom digital. Panel topics will span SPICE simulation requirements for variation analysis, 4- to 6-sigma Monte Carlo verification, high-sigma cell optimization, 3-sigma Monte Carlo verification, verification across 100,000+ PVT/parasitic corners and statistical PVT corners, FinFET variation, variation debug and analog calibration/trimming. Audience Q&A to follow panel discussion.
DAC is the premier conference devoted to the design and automation of electronic systems (EDA), embedded systems and software (ESS), and intellectual property (IP).
DAC 2017 will be held in Austin, Texas, at the Austin Convention Center. Get details about travel, hotels, and area attractions in one convenient spot.