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DAC Video Archives
49th DAC (2012)
48th DAC (2011)
47th DAC (2010)
46th DAC (2009)
45th DAC (2008)
44th DAC (2007)
43rd DAC (2006)
42nd DAC (2005)
41st DAC (2004)
40th DAC (2003)
39th DAC (2002)
38th DAC (2001)
Pre-38th DAC
Video Results for
48th DAC (2011)
6.1 Dimetrodon: Processor-Level Preventive Thermal Management via Idle Cycle Injection
6.2 Dynamic Thermal Management for Multimedia Applications Using Machine Learning
6.3 Improved Post-Silicon Power Modeling Using AC Lock-In Techniques
6.4 Thermal Signature: A Simple Yet Accurate Thermal Index for Floorplan Optimization
8.1 Scalable Parts Families, Context, and Computational Design for Gene Expression Engineering
8.2 Gene and Cellular Circuit Design
8.3 A Verifying Compiler for DNA Chemical Reaction Networks
12.1 TSV Stress-Aware, Full-Chip Mechanical Reliability Analysis and Optimization for 3-D IC
12.2 Hybrid Modeling of Non-Stationary Process Variations
12.3 Efficient SRAM Failure Rate Prediction via Gibbs Sampling
12.4 Direct Matrix Solution of Linear Complexity for Surface Integral Equation-Based Impedance Extraction of High Bandwidth Interconnects
18.1 MUSTARD: A Coupled, Stochastic-Deterministic, Discrete-Continuous Technique for Predicting the Impact of Random Telegraph Noise on SRAMs and DRAMs
18.2 Fast, Non-Monte-Carlo Transient Noise Analysis for High-Precision Analog/RF Circuits by Stochastic Orthogonal Polynomials
18.3 Automatic Stability Checking for Large, Linear Analog Integrated Circuits
18.4 Performance Bound Analysis of Analog Circuits Considering Process Variations
18.5 Rethinking Memory Redundancy: Optimal Bit Cell Repair for Maximum-Information Storage
18.6 Programmable Analog Device Array (PANDA): A Platform for Transistor-Level Analog Reconfigurability
19 EDA Research: Stalled, Driving in Circles, or Running out of Gas?
24.1 Leakage-Aware Redundancy for Reliable Subthreshold Memories
24.2 A 40nm Inverse Narrow-Width, Effect-Aware Subthreshold Standard Cell Library
24.3 Layout-Aware, Line-Edge Roughness Modeling and Poly-Optimization for Leakage Minimization
24.4 Post Sign-Off Leakage Power Optimization
25 Software-Hardware Verification Battle: Prototyping vs. Emulation
31 The Billion Dollar Question: How to Verify Billion-Gate Designs
37 ESL HW/SW Verification: A Reality Check
43 Double Trouble or Double Your Fun: Double-Patterning and Variability
49 Parallel or Paralyzing: Is Parallel EDA Worth the Trouble?
©2011 ACM/EDAC/IEEE Design Automation Conference. All rights reserved.
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