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The Design Automation Conference has been the most important resource for information on the electronic design and design automation industries for many decades.
Video Results for 48th DAC (2011)


CONVENED WEDNESDAY, June 08, 2011, 9:00 AM - 10:30 AM
VIDEO: SESSION 24
TOPIC AREA: LOW-POWER DESIGN
RESEARCH PAPER SESSION: Leakage Power Optimization
Chair:
David Garrett - Broadcom Corp., Irvine, CA


As the semiconductor industry continues its march down 32nm, leakage power continues to increase its dominance in the total power consumption. This session presents different exciting efforts to lower leakage power. The session starts with a paper that presents a leakage-aware redundancy for reliable subthreshold memories and continues with another that offers a 40nm subthreshold standard cell library, which takes inverse-narrow-width-effect into account. The session ends with two papers that propose line-edge roughness aware poly-layout optimization and post sign-off adjustments, respectively. The objective of both papers is to further reduce the leakage power.


24.1Leakage-Aware Redundancy for Reliable Subthreshold Memories
 Speaker: Seokjoong Kim - Univ. of California, Santa Cruz, CA
 Authors: Seokjoong Kim - Univ. of California, Santa Cruz, CA
Matthew Guthaus - Univ. of California, Santa Cruz, CA
24.2A 40nm Inverse Narrow-Width, Effect-Aware Subthreshold Standard Cell Library
 Speaker: Jan Stuyt - Holst Centre, Eindhoven, The Netherlands
 Authors: Jun Zhou - Institute of Microelectronics, Singapore, Singapore
Senthil Jayapal - Intel Corp., Penang, Malaysia
Ben Busze - Holst Centre, Eindhoven, The Netherlands
Li Huang - Holst Centre, Eindhoven, The Netherlands
Jan Stuyt - Holst Centre, Eindhoven, The Netherlands
24.3Layout-Aware, Line-Edge Roughness Modeling and Poly-Optimization for Leakage Minimization
 Speaker: Yongchan Ban - Univ. of Texas at Austin, TX
 Authors: Yongchan Ban - Univ. of Texas at Austin, TX
Jae-Seok Yang - Univ. of Texas at Austin, TX
24.4Post Sign-Off Leakage Power Optimization
 Speaker: Hamed Abrishami - Univ. of Southern California, Los Angeles, CA
 Authors: Hamed Abrishami - Univ. of Southern California, Los Angeles, CA
Jinan Lou - Google, Inc., Mountain View, CA
Jeff Qin - Synopsys, Inc., Mountain View, CA
Juergen Froessl - Synopsys, Inc., Mountain View, CA
Massoud Pedram - Univ. of Southern California, Los Angeles, CA